From contamination risk to the right cleanroom decision.

Clear contamination risk insights for contamination-critical products.

We use validated contamination models, not intuition, to assess risk and recommend cleanroom requirements.

Used in contamination sensitive product environments

Built for cleanroom professionals

Designed for professionals working with contamination-sensitive products in controlled environments:

  • Product and process developers
  • Quality engineers
  • Cleanroom managers
  • Production supervisors
  • Process engineers
To set and evaluate cleanliness requirements

From product specs to air cleanliness (cleanroom) requirements

Translate your product's contamination sensitivity into actionable cleanroom specifications. Based on ISO 14644 cleanroom standards.

The calculator determines for given vulnerabilities:

  • Maximum allowable particle deposition rates
  • Required local air cleanliness expressed as cleanroom class
  • Monitoring alarm limits

Three calculators in one

Choose the calculator that fits your situation:

  1. Product Sensitivity: Discover air cleanliness and particle deposition rate requirement for various product contamination inputs
  2. Cleanroom Capability: Evaluate the estimated performance of your current cleanroom setup
  3. Monitoring Setup: Configure alarm thresholds for particle deposition sensors or measurement methods
Learn About Particle Deposition

Background theory, formulas, and detailed explanations

Product contamination calculator

Enter your product specifications to assess contamination risk

Small critical particles

Smallest critical particle size (≥5 μm typical)
0.1 or more particles acceptable per product (decimals allowed)

Improve risk accuracy (optional)

Add production data to increase confidence in your contamination assessment.

Providing this information refines the precision of your risk estimate. You can complete the simulation without it.

Product specifications

Vulnerable surface area that must stay clean
Time surface is exposed during operations (not at-rest)

How it works

1. Define particle vulnerabilities

Critical particle size derived from the smallest circle around particle silhouette under microscope. Consider impact on product functionality.

2. Calculate deposition rate limits

RD = ND/(A·T) number of particles ≥ D μm per m² per hour.

  • ND is maximum acceptable number of particles on product
  • A is vulnerable product area
  • T is time of exposure of vulnerable product surface

Max acceptable number: If only a part of the products may have one particle, then give the number in steps of 0.1. For example: 1 particle per 5 products = 0.2

3. Assess contamination risk

Get Particle Deposition Rate Level L and particle number limit per sample (event limit)

Cleanroom calculator

Calculate expected cleanroom performance and ISO classification

Cleanroom specifications

Personnel parameters

Garment Levels:

0 - None: No protective clothing

1 - Basic: Head cover, shoe covers, cleanroom coat

2 - Standard: Head cover, overall, cleanroom shoes, gloves

3 - Advanced: Facemask, hood, overall, boots, gloves

4 - Full: Under garments, facemask, hood, overall, boots, gloves, goggles

Process location (optional)

Changing room (optional)

How it works

1. Air Cleanliness Level
  • C5 = S5 ε · Q + C5 at rest particles ≥ 5 μm per m³
  • In this calculation C5 at rest is neglected
2. Personnel Source Strength

S5 = activity level × average emission at low activity

Average emission depends on garment selection (Table)

3. Ventilation Efficiency

ε determines mixing efficiency: 0.5 (poor), 0.7 (typical), ≥1.0 (good ventilation)

4. Cleanroom ISO class

Classification based on particle concentration levels

At Process Location:
5. Particle deposition Rate Level

Empirical relation: air removable particles ≤ 40 μm

Particle deposition monitoring

Configure monitoring parameters and calculate event limits

Product parameters

Smallest critical particle size (≥10 μm typical)
0.1 or more particles acceptable per product

Monitoring method

Choose a predefined monitoring method or configure custom parameters

Sample configuration

How it works

1. What is an event limit?

The event limit is the maximum number of particles allowed in a single sample to stay within acceptable deposition rates.

2. Monitoring methods

APMON II: Continuous monitoring with 50 cm² surface, 4-minute intervals

Witness Plate: Passive monitoring with 64 cm² surface, typically 4-hour exposure